Login | Join Free

Hotline

4008-655-800
行业资讯
Practical dry goods! Summary of failure analysis of metal materials and parts

Date:2021-12-21 15:46:15

The failure forms and causes of metal materials are closely related. The failure forms are the apparent characteristics of the material failure process, which can be observed in an appropriate way. The failure reason is the physical and chemical mechanism leading to component failure, which needs to be diagnosed and demonstrated through the investigation and research of failure process and the macro and micro analysis of failed parts. View >>

How to detect electronic components? Several common detection methods

Date:2021-12-21 14:46:52

The detection of components is a basic skill of home appliance maintenance. How to accurately and effectively detect the relevant parameters of components and judge whether the components are normal is not a stereotype. Different methods must be adopted according to different components to judge whether the components are normal or not. View >>

Short circuit detection method and phenomenon analysis of IC chip

Date:2021-12-20 17:23:52

Chips are actually the gathering place of integrated circuits. A chip consists of thousands of integrated lattices. However, the level and density of specific chip integration are determined by the function and function of the chip. The phenomenon of IC chip damage also exists, but the premise is that the power supply to the chip is too high or the current is too large, which will lead to chip damage because the internal circuit of the chip exceeds its limit working current and voltage. View >>

Voltage test chip: working principle of low voltage detection RESET IC

Date:2021-12-20 17:20:53

With the rapid development of modern 5g, Internet of vehicles and other technologies, the signal transmission speed is faster and faster, and the power supply voltage of integrated circuit chip is smaller and smaller. The power supply of early chips was usually 5V and 3.3V, but now the power supply voltage of high-speed IC has reached 2.5V, 1.8V or 1.5V, and the nuclear voltage of some chips has even reached 1V. The smaller the supply voltage of the chip, the more severe the tolerance of voltage fluctuation becomes. How should the chip measure the voltage? View >>

Application of visual inspection system for semiconductor IC appearance

Date:2021-12-16 18:03:11

With the development of modern industrial science and technology, machine vision detection system is widely used in various fields, from medical images to remote sensing images, from industrial production detection to file processing, from nano technology to multimedia database, almost all occasions requiring human vision require machine vision detection system, especially in some fields that require high requirements or cannot be perceived by human vision, For example, accurate quantitative perception, dangerous scene perception, invisible object perception and so on, the role of machine vision detection system is particularly important. View >>

Electronic components X-ray scanning detection of counterfeit components

Date:2021-12-15 15:14:47

X-ray, commonly known as X-ray, has the function of penetrating the object for perspective, so it is often used to detect the internal defects of the object. It has a wide range of applications, among which the electronic semiconductor industry needs to test the product quality with the help of the performance of X-ray testing equipment. Electronic semiconductors often need to detect SMT and circuit board patches. Items to be tested include internal bubbles, internal slag inclusions, inclusions, cracks, missing welding, etc. View >>

Test and analysis of electrical stress failure of electrical devices

Date:2021-12-15 15:09:56

Due to the continuous improvement of science and technology in modern society, the application scope of electronic devices is expanding. Electronic devices can be seen everywhere in our life and work. Due to the wide range of applications of electronic devices, the failure phenomena of electronic devices are also diverse and can be seen everywhere. Electrical stress failure is an important aspect of electronic device failure. The analysis and research of electrical stress failure of electrical devices is of far-reaching significance to the production, use and R & D of electronic devices. View >>

RoHS component analysis and detection of electronic and electrical products

Date:2021-12-14 18:37:00

With the increasingly strict laws and regulations and corresponding law enforcement established by various countries for the safety and environmental protection characteristics of electronic and electrical products, how to stand out in the market competition and turn challenges into opportunities is a common topic faced by many electronic and electrical related enterprises. In the electronic and electrical field, there is a mandatory standard RoHS formulated by EU legislation. As the first step of electronic and electrical environmental protection, it is one of the basic access thresholds for electronic and electrical products to enter the market. View >>

What are the main reliability testing methods for electronic components?

Date:2021-12-13 16:36:00

Speaking of electronic components, we should not be unfamiliar. What about the reliability of electronic components? The reliability of electronic components is an important factor affecting product reliability. Reliability test is to determine whether the products transferred to mass production through reliability identification test meet the specified reliability requirements under specified conditions, and to verify whether the reliability of products decreases with the changes of process, tooling, workflow, parts quality and other factors during mass production. Only through these, can the product performance be trusted and the product quality be excellent. View >>

Function and standard of NDT for welded workpieces

Date:2021-12-13 16:33:00

Penetrant testing is a non-destructive testing method based on the principle of capillary action to inspect surface opening defects. Penetrant testing can be used to detect the surface opening defects of metal and non-metal workpieces, which is not affected by the structure, chemical composition and defect shape of the inspected workpieces. However, conventional penetrant testing cannot or is difficult to inspect porous materials, and is not suitable for detecting defects that the opening is blocked due to external factors. Because of its simplicity and easy operation, penetrant testing is widely used in various fields of modern industry. View >>

Baidu
map